Tel: 805.527.7657 (USA)
INSPECTION & METROLOGY
Short Wave Infrared Microscope
Mid Wave Infrared for Defect Detection and Analysis
Small Format Standard and Right Angle Viewing Microscope
PRODUCTS
Providing creative solutions for Inspection, Metrology, and Infrared Imaging.
Advanced Spectral Technology, Inc. (AST) provides manual to fully automated precision motion controlled systems, utilizing application specific optical designs and sensors in any of the Infrared, Visible and UV spectrums. AST employs the latest cutting edge technologies and expertise to solve the industry's most challenging defect detection, inspection, infrared imaging, and metrology requirements. AST additionally serves industries that require semiconductor wafer inspection, thermography, and atmospheric plasma surface preparation.
While we primarily serve the Semiconductor/MEMS, Aerospace & Defense, and Medical fields, we're continually seeking to meet the needs of all industries which require creative and innovative solutions to their most diverse applications.
Product Applications
Defect Inspection
Defect inspection and detection is a vital step in the production of critical compoments, such as those used in the aerospace, medical, and semiconductor/MEMS industries. AST carries a full line of systems specifically designed for inspection, defect detection and fault analysis. Additionally, AST can customize our systems to accommodate your specific requirement.
Recommended Systems:
• AST-200 Advanced Defect Inspection & Metrology System
• AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
• AST-M200C Mid Wave Infrared Inspection System
• AST-S200T Short Wave Infrared Microscope System
• AST-230M Ergonomic Metrology Workstation
• AST-M150T Mid Wave Infrared Microscope for Defect Detection & Analysis
• Customized Z-Scopes for all your inspection and measurement requirements
Metrology
Metrology is a post-process series of measurements by which manufactured parts are checked and verified for overall consistency. Many industries, such as aerospace, must maintain tight tolerances and shapes for their components, and the science of metrology is an indispensable part of their production process. AST employs the highest quality materials and components in their metrology systems, which ensure accuracy in your mission-critical products.
Recommended Systems:
• AST-200 Advanced Defect Inspection & Metrology System
• AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
• AST-230M Ergonomic Metrology Workstation
• Customized Z-Scopes for all your inspection and measurement requirements
Infrared & Thermal Imaging
Allows defect inspection and metrology within materials transparent to the infrared wavelengths being used. Thermal Imaging detects infrared radiation emitted by all objects above absolute zero according to the black body radiation law. Thermography makes it possible to see one's environment with or without visible illumination, allowing one to see variations in temperature.
Recommended Systems:
• AST-200 Advanced Defect Inspection & Metrology System
• AST-200H Advanced Defect Inspection & Metrology System with Wafer Handling
• AST-M200C Mid Wave Infrared Inspection System
• AST-S200T Short Wave Infrared Microscope System
• AST-M150T Mid Wave Infrared Microscope for Defect Detection & Analysis
• Customized Z-Scopes for all your inspection and measurement requirements
Plasma Surface Preparation
Because oxides and organic contaminants can compromise certain production processes, such as solder bonding, wire bonding, thin film deposition, and plating, it is critical to have a substrate that is properly cleaned of contaminants and ready to accept these subsequent processes. AST provides industry with the Ontos7, a plasma-based surface cleaning and preparation system, with zero hazardous byproducts or waste.
Recommended System:
Defect Inspection
Metrology
Infrared & Thermal Imaging
Plasma Surface Preparation
